Beam Dynamics Effects of Insertion Devices at Tps
Mau-Sen Chiu1*, Fan-Hsin Tseng1, Ting-Yi Chung2, Jui-Che Huang2, Ping-Jung Chou1
1Beam Dynamics, NSRRC, Hsinchu, Taiwan
2Magnet Group, NSRRC, Hsinchu, Taiwan
* Presenter:Mau-Sen Chiu, email:chiu.ms@nsrrc.org.tw
The imperfection of insertion devices (IDs) due to finite size of magnet blocks and filed errors will cause electron orbit distortion, beta beat and tune shift. The intrinsic non-linear fields of IDs will make the electron beam unstable and leads to reduction of injection efficiency and beam lifetime. The simulation code of Tracy is employed to evaluate the beam dynamics effects of IDs modeled by kick maps at TPS (Taiwan Photon Source). Dynamic aperture, frequency map analysis and Touschek lifetime due to IDs will be presented in this report.


Keywords: Taiwan Photon Source, Insertion Device, Beam Dynamics